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Jual Spectrophotometer Evolution™ 350 Thermo Scientific
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Jual Spectrophotometer Evolution™ 350 Thermo Scientific
Description
Evolution™ 350 UV-Vis Spectrophotometer, Cat. No. 840-310800
Designed for laboratories requiring higher performance, the Thermo Scientific™ Evolution™ 350 UV-Vis Spectrophotometer’s double beam optical design delivers precision and outstanding reliability for advanced applications. From sample to final report, intuitive software quickly guides you through each step of your analysis. Comprehensive tools for data collection, processing and reporting deliver the results you need for quantitative analysis, scanning and kinetics applications. Expansive accessory choices offer flexibility to analyze almost any sample type.
Specification :
| Product Size | – |
| Baseline Flatness | ±0.0015 A (200–800 nm) 2.0 nm SBW, smoothed |
| Description | Evolution 350 Spectrophotometer |
| Detector Type | Dual Matched Silicon Photodiodes |
| Dimensions (L x W x H) | 53 x 61 x 38 cm / 20.8 x 24 x 14.9 in. |
| Drift | <0.0005 Abs/hour, 500 nm, 2.0 nm SBW, 2 hr warm-up |
| Electrical Requirements | 100–240 V, 50–60 Hz |
| For Use With (Application) | Academic, Chemicals, Food & Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals |
| Lamp | Xenon Flash Lamp Typical Lifetime: >5 years. Longer if not using live signal Warranty Period: 3 year source replacement warranty |
| Noise | Photometric 0A: <0.00018 A 1A: <0.00022 A 2A: <0.00050 A 500 nm, 2.0 nm SBW, RMS |
| Optical Design | Modified Ebert; Double beam with sample and reference cuvette/accessory positions |
| Pharmacopoeia Compliance Testing | Resolution (Toluene in Hexane) Peak/Trough Ratio >1.8 with 1nm slit setting Photometric Accuracy (60mg/L K2Cr2O7) <±0.01 A relative to calibrated sealed standard Stray Light <0.13 %T at 198 nm with KCl per EP 220 nm: <0.01%T NaI (behaves identically to KI for USP) Wavelength Accuracy ±0.20 nm (546.11 nm Hg emission line), ±0.30 nm 190–900 nm Wavelength Repeatability Peak separation of repetitive scanning of Hg line source <0.10 nm |
| Photometric Accuracy Instrument | 1A: ±0.004 A 2A: ±0.004 A 3A: ±0.006 A
Measured at 546 nm using neutral density filters traceable to NIST. When testing instrument performance, the specification used for pass/fail determination is the sum of the instrument specification listed here and the uncertainty in the calibration data for the filter, listed on the calibration certificate. |
| Photometric Display | ±6 A |
| Photometric Range | >4 A |
| Photometric Readout | Absorbance, % Transmission, % Reflectance, Kubelka-Munk, Log (1/R), Log(ABS), ABS x Factor, Intensity |
| Photometric Repeatability | 1A: ±0.0025 A |
| Scan Ordinate Modes | Absorbance, % Transmittance, % Reflectance, Concentration, 1st–4th Derivative |
| Spectral Bandwidth | Variable 0.5, 1.0, 1.5, 2.0, 4.0 nm |
| Stray Light | 198 nm: 2.9 A KCl 220 nm: 4.2 A NaI 340 nm: 4.3 A NaNO2 |
| Wavelength Accuracy | ±0.20 nm (546.11 nm Hg emission line), ±0.30 nm 190–900 nm |
| Wavelength Data Interval | 10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm |
| Wavelength Range | 190–1100 nm |
| Wavelength Repeatability | Standard deviation of 10 measurements <0.05 nm |
| Wavelength Scan Speed | 3800, 2400, 1200, 600, 240, 120, 60, 30, 10, 5, 1 nm/min Intelliscan |
| Weight (English) | 48.5 lbs |
| Weight (Metric) | 22 kg |
